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For Table of Contents Only
An effective technique for determination of ionic composition (U4+, U5+, U6+) and oxygen coefficient in UO2+x was introduced and developed. This method is based on the U 5f and U 4f XPS peak intensities. The suggested technique allowed a determination of the surface ionic uranium composition and the oxygen coefficient in heavily 129Xe23+ irradiated (92 MeV, 4.8×1015 ions/cm2) uranium dioxide thin films, when the traditional approach was impossible to be employed.
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