11.13-rasm.
11.4.4. Datagrammaga asoslangan paketli kommutatsiya
Datagramma kommutatsiya tarmog'i aloqa davridagi eng muhim jarayonlar 11.14-rasmda ko'rsatilgan. Boshlang’ich-tugun aloqa yo’lidagi birinchi oraliq tugunni aniqlaydi va paketlarni yuborishni boshlaydi. Har bir paketda boshlang’ich tugun va oxirgi tugun identifikatori mavjud bo’ladi. Birinchi oraliq (A tugun) tugun kelayotgan xabarlarni to’liq saqlamasdan turib keyingi oraliq tugunga paketlarni yuborishni boshlaydi .
11.14-rasm
Bu jarayon oxirgi tugungacha takrorlanadi. Bu uslubda aloqani bog’lash va uzish jarayoni bo’lmaganligi sababli,har bir paket uchun boshlang'ich tugundan oxirgi tugungacha bo'lgan yo'l har xil bo'lishi mumkin va buning oqibatida xabar uzatishda turli kechkishlar sodir bo’lishi va xabar paketlari tartibsiz ko’rinishda kelishi mumkin.
Foydalanilgan adabiyotlar.
Dr. Daniel J. MLYNEK, Yusuf Leblebici. Design of VLSI systems. Online course. http://emicroelectronics.free.fr/onlineCourses/VLSI/index.html .KGF 11/10/1998
[Abramovic91] М. Abramovic, M. Breuer, and А. Friedman, Digital Systems Testing and Testable Design, IEEE Press, Piscataway, NJ, 1991.
[Agrawal88] V. Agrawal and S. Seth, Eds. Test Generation for VLSI Chips, IEEE Computer Society Press, 1988.
[Bhavsar01] D. Bhavsar, (“Testing of High-Performance Microprocessors", in Design of High-Performance Microprocessor Circuits, А. Chandrakasan et al., Ed., р. 523-544, IEEE P1·ess, 2001.
[Eichelbeigei-78] Е. Eichelberger and Т. Williams, "А Logic Design Structure for VLSI Testability", Journal оп Design Automation of Fault-Tolerant Computing, Мау 1978, vol. 2, р. 165-178.
[Goel81] Р. Goel, “An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits", IEEE Тrans оn Computers, June 1981, vol. С-30, по. 3, р. 26-268.
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