• DEVELOPMENT OF TECHNOLOGY FOR CREATING HIGH-VOLTAGE p 0 – n 0 JUNCTIONS BASED ON GaAs
  • Namangan Institute of Engineering and Technology nammti uz




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    Namangan Institute of Engineering and Technology 
    nammti.uz 
    10.25.2023
    Pg.266 
    [1] O’Regan, B. and Grätzel, M. (1991) A Low-Cost, High-Efficientcy Solar-Cell Based on Dye 
    Sensitized Colloidal TiO2 Films. Nature, 353, 737-740. 
    [2] O.Mamatkarimov, A.Abdukarimov. About The Characteristics Of Multilayer Thin-Film 
    Structures With Dyes Based On Titanium Dioxide. Euroasian Journal of Semiconductors Science and 
    Engineering 2 (3), 28, 2021. 
    [3]A. Abdukarimov, I.S. Noor, O. Mamatkarimov, A.K. Arof.“Influence of charge carrier 
    density, mobility and diffusivity on conductivity–temperature dependence in polyethylene oxide–
    based gel polymer electrolytes” - High Performance Polymers, 2021 
    DEVELOPMENT OF TECHNOLOGY FOR CREATING HIGH-VOLTAGE p
    0
     – n
    0
     JUNCTIONS BASED 
    ON GaAs 
    A.M.Sultanov, A.A.Abdukarimov,
    Namangan Engineering and Technology Institute,Uzbekistan,
    abdullaziz.abdukarimov@mail.ru
     
    The main problem in creating subnano- and picosecond switches based on GaAs is to obtain 
    layers with a given thickness of the base regions and a low dopant concentration. A study was made 
    of the influence of technological factors on the properties of epitaxial layers and p
    0
    -n
    0
    junctions. 
    The thickness of the n
    0
    -layer, exceeding the dimensions of the space-charge layer at zero 
    mixing of the p-n junction, was (30–35) µm and provided the possibility of effective separation of 
    electron-hole pairs created by absorbed radiation[1-2]. The control of the position of the p-n 
    transition, the estimation of the size of the space charge region was carried out by a method based 
    on the observation of the electro-optical effect in gallium arsenide during the passage of plane 
    polarized infrared light through the crystal. 
    For the efficient operation of thyristors and transistors, the thickness of the p0-part should 
    be as small as possible, therefore, for them manufacturing can only be used n
    +
    - р
    0
    -n
    0
    structures 
    with certain thicknesses p
    0
    - areas that provide high 
    transfer coefficient values. Defined 
    temperature dependence of p
    0
    -layer on temperature the beginning of crystallization (Fig. 1), and 
    coefficients segregation of fine acceptor and donor impurities the level of concentration and the 
    degree of compensation [3-4]. 

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